Abstract: The evaluation from experimental data, of physical quantities, which enter into the electromagnetic Maxwell equations, is described as inverse optical problem. The functional relations between the dependent and independent variables are of transcendental character and numeric procedures for evaluation of the unknowns are largely used. Herein, we discuss a direct approach to the solution, illustrated by a specific example of determination of thin films optical constants from spectrophotometric data. New algorithm is proposed for the parameters evaluation, which does not need an initial guess of the unknowns and does not use iterative procedures. Thus we overcome the intrinsic deficiency of minimization techniques, such as gradient search methods, Simplex methods, etc. The price of it is a need of more computing power, but our algorithm is easily implemented in structures such as grid clusters. We show the advantages of this approach and its potential for generalization to other inverse optical problems.

Keywords: Thin films; Materials and process characterization

ACM Classification Keywords: J.2 Physical Sciences and Engineering (Physics)

Link:

ON A DIRECT APPROACH TO THE SOLUTION OF INVERSE OPTICAL PROBLEMS

Peter Sharlandjiev, Georgi Stoilov

http://www.foibg.com/ibs_isc/ibs-05/IBS-05-p06.pdf