Abstract: Today together with actual designing and tests it is often used virtual methods of designing, which support prior calculations of parameters of the developed devices. Such parameters include reliability. For this purpose the virtual laboratory for computer-aided design, which is developed during joint project by V.M. Glushkov Institute of Cybernetics of NAS of Ukraine and Institute of Mathematics and Informatics of BAS, contains program unit for calculating reliability parameters of separate microelectronic components and whole devices. The program unit work is based on two computing method: the first one uses exponential distribution of failure probability and the second one – DN-distribution of failure probability. Presence of theoretical materials, computing methods description and other background materials lets to use this program unit not only for designing and scientific researches, but also in education process.

Keywords: Virtual Laboratory; Computer-Aided? Design; Reliability Calculation; Distributed System.

ACM Classification Keywords: J.6 Computer-Aided? Engineering – Computer-Aided? Design (CAD); K.4.3 Organizational Impacts – Computer-Supported? Collaborative Work.

Link:

CALCULATING OF RELIABILITY PARAMETERS OF MICROELECTRONIC COMPONENTS AND DEVICES BY MEANS OF VIRTUAL LABORATORY

Oleksandr Palagin, Peter Stanchev, Volodymyr Romanov, Krassimir Markov, Igor Galelyuka, Vitalii Velychko, Oleksandra Kovyriova, Oksana Galelyuka, Iliya Mitov, Krassimira Ivanova

http://foibg.com/ibs_isc/ibs-18/ibs-18-p15.pdf