Abstract: The paper describes the original device for the examination and control of authenticity of reflection holograms. The operating principle of the device is based on measuring the parameters of diffraction gratings constituting the hologram and obtains estimates of its authenticity by comparing them with the reference values. Measurement of diffraction gratings parameters is based on the ability of the reflection holograms to decompose the white light into it spectral components. Scanning the hologram at different angles allows obtaining sufficient information for calculating the internal parameters of the hologram throughout the area.

Keywords: hologram, authenticity

ACM Classification Keywords: CCS - Applied computing - Computer forensics - Investigation techniques

Link:

ИССЛЕДОВАНИЕ И ПРОВЕРКА ПОДЛИННОСТИ ЗАЩИТНЫХ ГОЛОГРАММ (Examination and Authenticity Control of Secure Holograms)

Роман Телятников, Иван Шумский, Михаил Беляцкий, Юрий Карякин

http://www.foibg.com/ijitk/ijitk-vol09/ijitk09-01-p08.pdf